Accelerated life test of high power white light emitting diodes based on package failure mechanisms

Microelectronics Reliability

Volumn 51, Issue 9-11, 2011, Pages 1806-1809

  Chan, S I ^a   Hong, W S ^a   Kim, K T ^b   Yoon, Y G ^c   Han, J H ^c   Jang, J S ^b  

^a Korea Electronic Technology Institute (KETI)   (South Korea)

^b Ajou University   (South Korea)

^c Korea Testing Certification   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED LIFE TESTS; AGING TESTS; BLUE WAVELENGTH; DEGRADATION MECHANISM; HIGH-POWER; HUMIDITY TESTS; OPTICAL POWER; PACKAGE FAILURES; WHITE LIGHT EMITTING DIODES; YELLOW EMISSIONS;

DEGRADATION; LIGHT EMISSION; SILICONES; TESTING;

LIGHT EMITTING DIODES;

EID: 80052945079     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2011.07.042     Document Type: Conference Paper

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