Life-time estimation of high-power blue light-emitting diode chips

Microelectronics Reliability

Volumn 49, Issue 9-11, 2009, Pages 1231-1235

  Kang, Jeung Mo ^a   Kim, Jae Wook ^a   Choi, Jeong Hyeon ^a   Kim, Du Hyun ^a   Kwon, Ho Ki ^a  

^a LED R and D Center   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AGING TIME; BLUE LED CHIPS; BLUE LIGHT-EMITTING; DEGRADATION BEHAVIOR; ELECTRICAL CHARACTERISTIC; HIGH-POWER; LED CHIPS; LIFE-TIMES; METAL PACKAGES; NEW CONCEPT; REVERSE LEAKAGE CURRENT;

CURRENT DENSITY; DEGRADATION; LIGHT EMISSION; LIGHT TRANSMISSION;

LIGHT EMITTING DIODES;

EID: 69349098494     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2009.07.052     Document Type: Article

References (8)

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