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Journal of Applied Physics

Volumn 81, Issue 4, 1997, Pages 1633-1638

Dislocation motion in GaN light-emitting devices and its effect on device lifetime

(1) Sugiura, Lisa a

a TOSHIBA CORPORATION (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003610689 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.364018 Document Type: Article

Times cited : (123)

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