SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 483, Issue 1-2, 2005, Pages 378-381

Study of degradation mechanism of blue light emitting diodes

(3) Uddin, A a Wei, A C a Andersson, T G b

a NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

b CHALMERS UNIVERSITY OF TECHNOLOGY (Sweden)

Author keywords

Aging mechanism; Light emitting diode; Reliability; Semiconductor

Indexed keywords

AGING MECHANISM; EPITAXIAL LAYERS; METAL ATOMS; TRANSIENT SPECTROSCOPY;

AGING OF MATERIALS; CAPACITANCE; CONCENTRATION (PROCESS); ELECTRIC POTENTIAL; GALLIUM NITRIDE; LIGHT EMISSION; RELIABILITY; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR QUANTUM WELLS;

LIGHT EMITTING DIODES;

EID: 18844413231 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2005.01.018 Document Type: Article

Times cited : (56)

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