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Volumn 1, Issue 1, 2005, Pages 167-170

Life of LED-based white light sources

Author keywords

Degradation; Life; Light source; White light emitting diode (LED)

Indexed keywords

LIFE; P-N-JUNCTIONS; WHITE LIGHT EMITTING DIODES (WLED); WHITE LIGHT SOURCES;

EID: 27744468281     PISSN: 1551319X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JDT.2005.852510     Document Type: Article
Times cited : (693)

References (11)
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    • (2005) ASSIST Recommends: LED Life for General Lighting [Online]
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    • D. L. Barton, M. Osinski, P. Perlin, C. J. Helms, and N. H. Berg, "Life tests and failure mechanisms of GaN/AlGaN/InGaN light emitting diodes," in Proc. SPIE, vol. 3279, San Jose, CA, 1998, pp. 17-27.
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  • 9
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    • Aging mechanisms of InGaN/AlGaN/GaN light emitting diodes operating at high currents
    • F. Manyakhin, A. Kovalev, and A. E. Yunovich, "Aging mechanisms of InGaN/AlGaN/GaN light emitting diodes operating at high currents," MRS Internet J. Nitride Semicond. Res., vol. 3, p. 53, 1998.
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    • Manyakhin, F.1    Kovalev, A.2    Yunovich, A.E.3
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    • N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, "Solid-state lighting: failure analysis of white LEDs," J. Cryst. Growth, vol. 268, no. 3-4, pp. 449-456, Aug. 2004.
    • (2004) J. Cryst. Growth , vol.268 , Issue.3-4 , pp. 449-456
    • Narendran, N.1    Gu, Y.2    Freyssinier, J.P.3    Yu, H.4    Deng, L.5
  • 11
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    • A noncontact method for determining junction temperature of phosphor-converted white LEDs
    • San Diego, CA
    • Y. Gu and N. Narendran, "A noncontact method for determining junction temperature of phosphor-converted white LEDs," in Proc. SPIE Third Int. Conf. on Solid State Lighting, vol. 5187, San Diego, CA, 2003, pp. 107-114.
    • (2003) Proc. SPIE Third Int. Conf. on Solid State Lighting , vol.5187 , pp. 107-114
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.