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Volumn 5, Issue 19, 2013, Pages 8781-8798

Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL COMPOSITIONS; CHEMICAL PROCESS; COMPARATIVE ADVANTAGE; CRYSTALLINE STRUCTURE; FUNCTIONAL PROPERTIES; INSTRUMENTAL METHODS; METROLOGY METHODS;

EID: 84884249876     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c3nr02372a     Document Type: Review
Times cited : (53)

References (229)
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    • D. Briggs and J. T. Grant, in Applications Of Surface Science, ed., D. Briggs, and, J. T. Grant, IM Publications, Chichester, 2003, pp. 31-56
    • (2003) Applications of Surface Science
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  • 214
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    • ed. R. Borsali and R. Pecora, Springer, Berlin, 1st edn, 335-372
    • B. Chu, in Soft-Matter Characterization, ed., R. Borsali, and, R. Pecora, Springer, Berlin, 1st edn, 2008, pp. 335-372
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    • Chu, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.