Chemical mapping and quantification at the atomic scale by scanning transmission electron microscopy

ACS Nano

Volumn 7, Issue 6, 2013, Pages 4700-4707

  Chu, Ming Wen ^a   Chen, Cheng Hsuan ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM PROBE TOMOGRAPHY; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; EXPERIMENTAL TECHNIQUES; INDIVIDUAL OBJECTS; NANOPHOTONIC MATERIALS; SCANNING OPTICAL MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCANNING TRANSMISSION X RAY MICROSCOPY;

ATOMS; CHARACTERIZATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; GROWTH (MATERIALS); SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

INTERFACES (MATERIALS);

EID: 84879649017     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn4023558     Document Type: Review

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