메뉴 건너뛰기




Volumn 51, Issue 1, 2006, Pages 61-149

X-ray texture tomography of near-surface areas

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COMPOSITE MATERIALS; CRYSTALLINE MATERIALS; MATERIALS SCIENCE; NONDESTRUCTIVE EXAMINATION; STRUCTURAL ANALYSIS; TEXTURES; X RAYS;

EID: 25644443874     PISSN: 00796425     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.pmatsci.2005.05.001     Document Type: Review
Times cited : (17)

References (80)
  • 2
    • 0017455128 scopus 로고
    • Textures of copper single crystals after rolling at room temperature
    • R.E. Bauer, H. Mecking, and K. Lücke Textures of copper single crystals after rolling at room temperature Mater Sci Eng 27 1977 163 180
    • (1977) Mater Sci Eng , vol.27 , pp. 163-180
    • Bauer, R.E.1    Mecking, H.2    Lücke, K.3
  • 3
    • 25644435858 scopus 로고
    • Nonhomogeneity of texture in the rolling of nickel
    • G. Gottstein K. Lücke Springer Verlag Berlin
    • W. Truszkowski, J. Pospiech, M. Betzl, and J. Jura Nonhomogeneity of texture in the rolling of nickel G. Gottstein K. Lücke Proc of 5th ICOTOM, Aachen 1978 Springer Verlag Berlin 253 262
    • (1978) Proc of 5th ICOTOM, Aachen , pp. 253-262
    • Truszkowski, W.1    Pospiech, J.2    Betzl, M.3    Jura, J.4
  • 4
    • 0020174127 scopus 로고
    • Inhomogene texturen
    • H.J. Bunge Inhomogene texturen Z Metall 73 1982 483 488
    • (1982) Z Metall , vol.73 , pp. 483-488
    • Bunge, H.J.1
  • 5
    • 0022875555 scopus 로고
    • Recrystallization texture of inhomogeneous fcc materials
    • B. Major Recrystallization texture of inhomogeneous fcc materials Arch Metall 31 1986 117 128
    • (1986) Arch Metall , vol.31 , pp. 117-128
    • Major, B.1
  • 6
    • 0000451164 scopus 로고
    • Non destructive investigation of texture by neutron diffraction
    • C.S. Choi, H.J. Prask, and S.F. Trevino Non destructive investigation of texture by neutron diffraction J Appl Cryst 12 1979 327 331
    • (1979) J Appl Cryst , vol.12 , pp. 327-331
    • Choi, C.S.1    Prask, H.J.2    Trevino, S.F.3
  • 7
    • 36149032703 scopus 로고
    • A method of texture inhomogeneity estimation from reflection pole figures
    • A. Morawiec A method of texture inhomogeneity estimation from reflection pole figures J Phys: Condens Matter 4 1992 339 349
    • (1992) J Phys: Condens Matter , vol.4 , pp. 339-349
    • Morawiec, A.1
  • 8
    • 0026930908 scopus 로고
    • Determination of texture inhomogeneity in near surface layers Experimental verification
    • J. Bonarski, and A. Morawiec Determination of texture inhomogeneity in near surface layers Experimental verification J Appl Cryst 25 1992 624 627
    • (1992) J Appl Cryst , vol.25 , pp. 624-627
    • Bonarski, J.1    Morawiec, A.2
  • 9
    • 0028666477 scopus 로고
    • Application of the method for nondestructive evaluation of texture heterogeneity
    • Bunge HJ, editor Trans Tech Publ, Switzerland. Material science forum
    • Tarasiuk J, Wierzbanowski K, Baczmanski A. Application of the method for nondestructive evaluation of texture heterogeneity. In: Bunge HJ, editor. Proc ICOTOM-10, Trans Tech Publ, Switzerland. Material science forum 1992;157-162:213-20.
    • (1992) Proc ICOTOM-10 , vol.157-162 , pp. 213-220
    • Tarasiuk, J.1    Wierzbanowski, K.2    Baczmanski, A.3
  • 10
    • 0345816936 scopus 로고
    • X-ray diffraction method for determination of texture evolution in layers
    • I. Tomov, R. Banova, and S. Surnev X-ray diffraction method for determination of texture evolution in layers Textures Microstruct 19 1992 189 196
    • (1992) Textures Microstruct , vol.19 , pp. 189-196
    • Tomov, I.1    Banova, R.2    Surnev, S.3
  • 11
    • 0028666457 scopus 로고
    • Investigation of inhomogeneous textures of coatings and near surface layers
    • Bunge HJ, editor Trans Tech Publ, Switzerland. Material science forum
    • Bonarski JT, Wcislak L, Bunge HJ. Investigation of inhomogeneous textures of coatings and near surface layers. In: Bunge HJ, editor. Proc ICOTOM-10, Trans Tech Publ, Switzerland. Material science forum 1994;157-162:111-7.
    • (1994) Proc ICOTOM-10 , vol.157-162 , pp. 111-117
    • Bonarski, J.T.1    Wcislak, L.2    Bunge, H.J.3
  • 12
    • 0028666686 scopus 로고
    • X-ray texture analysis in films by the reflection method
    • Bunge HJ, editor Trans Tech Publ, Switzerland. Material Science Forum
    • Chateigne D, Germi P, Pernet M. X-ray texture analysis in films by the reflection method. In: Bunge HJ, editor. Proc ICOTOM-10, Trans Tech Publ, Switzerland. Material Science Forum 1994;157-162:1379-86.
    • (1994) Proc ICOTOM-10 , vol.157-162 , pp. 1379-1386
    • Chateigne, D.1    Germi, P.2    Pernet, M.3
  • 13
    • 0028666466 scopus 로고
    • Optimization of the texture determination of films from X-ray diffraction measurements
    • Bunge HJ, editor Trans Tech Publ, Switzerland. Material science forum
    • Moreau B, Wagner F, Göbel H. Optimization of the texture determination of films from X-ray diffraction measurements. In: Bunge HJ, editor. Proc ICOTOM-10, Trans Tech Publ, Switzerland. Material science forum 1994;157-162:159-66.
    • (1994) Proc ICOTOM-10 , vol.157-162 , pp. 159-166
    • Moreau, B.1    Wagner, F.2    Göbel, H.3
  • 14
    • 0028666468 scopus 로고
    • Equipment for texture measurement in thin films
    • Bunge HJ, editor. Trans Tech Publ, Switzerland: Material Science Forum
    • Szpunar J, Blandford P. Equipment for texture measurement in thin films. Proc ICOTOM-10. In: Bunge HJ, editor. Trans Tech Publ, Switzerland: Material Science Forum 1994;157-162:207-212.
    • (1994) Proc ICOTOM-10 , vol.157-162 , pp. 207-212
    • Szpunar, J.1    Blandford, P.2
  • 15
    • 0028666472 scopus 로고
    • Characterization of multilayers crystallographic texture
    • Bunge HJ, editor Trans Tech Publ, Switzerland: Material science forum
    • Tizliouine A, Bessieres J, Heizmann JJ, Bobo JF. Characterization of multilayers crystallographic texture. In: Bunge HJ, editor. Proc ICOTOM-10, Trans Tech Publ, Switzerland: Material science forum 1994;157-162:227-34.
    • (1994) Proc ICOTOM-10 , vol.157-162 , pp. 227-234
    • Tizliouine, A.1    Bessieres, J.2    Heizmann, J.J.3    Bobo, J.F.4
  • 16
    • 0028666699 scopus 로고
    • X-ray diffraction study of texture evolution in electrodeposited zinc layers
    • Bunge HJ, editor Trans Tech Publ, Switzerland: Material science forum
    • Tomov I. X-ray diffraction study of texture evolution in electrodeposited zinc layers. In: Bunge HJ, editor. Proc ICOTOM-10, Trans Tech Publ, Switzerland: Material science forum 1994;157-162:1495-1500.
    • (1994) Proc ICOTOM-10 , vol.157-162 , pp. 1495-1500
    • Tomov, I.1
  • 19
    • 0002101406 scopus 로고    scopus 로고
    • Investigation of inhomogeneous surface textures with constant information depth: Part 1: Fundamentals
    • J. Bonarski, H.J. Bunge, L. Wcislak, and K. Pawlik Investigation of inhomogeneous surface textures with constant information depth: Part 1: Fundamentals Textures Microstruct 31 1-2 1998 21 41
    • (1998) Textures Microstruct , vol.31 , Issue.1-2 , pp. 21-41
    • Bonarski, J.1    Bunge, H.J.2    Wcislak, L.3    Pawlik, K.4
  • 21
    • 25644440932 scopus 로고    scopus 로고
    • Gradientometria grawitacyjna (transl. from eng.)
    • E.R. Bell Gradientometria grawitacyjna (transl. from eng.) Swiat Nauki 8 1997 56 61
    • (1997) Swiat Nauki , vol.8 , pp. 56-61
    • Bell, E.R.1
  • 24
    • 0032345429 scopus 로고    scopus 로고
    • Development of texture determination method for the near surface layers
    • J. Bonarski, and K. Pawlik Development of texture determination method for the near surface layers Arch Metall 43/2 1998 142 148
    • (1998) Arch Metall , vol.43 , pp. 142-148
    • Bonarski, J.1    Pawlik, K.2
  • 25
    • 0016572117 scopus 로고
    • Badania tekstur blach glebokotlocznych ze stali 08X przy uzyciu odwrotnych figur biegunowych
    • A. Panta, and J. Karp Badania tekstur blach glebokotlocznych ze stali 08X przy uzyciu odwrotnych figur biegunowych Hutnik 11 1975 430 435
    • (1975) Hutnik , vol.11 , pp. 430-435
    • Panta, A.1    Karp, J.2
  • 26
    • 0029262957 scopus 로고
    • On the formation of texture in deep drawing steels
    • W. Lotter, and H.P. Hougardy On the formation of texture in deep drawing steels Z Metall 86 3 1978 164 170
    • (1978) Z Metall , vol.86 , Issue.3 , pp. 164-170
    • Lotter, W.1    Hougardy, H.P.2
  • 28
    • 25644455512 scopus 로고
    • The orientation distribution function in space of orientation
    • Quantitative analysis of texture, Krakow; Katowice 'SITPH'
    • Pospiech J, Jura J. The orientation distribution function in space of orientation. Proc of Int Seminar; Quantitative analysis of texture, Krakow (1971); Katowice 'SITPH' 1972;73-85.
    • (1971) Proc of Int Seminar , pp. 73-85
    • Pospiech, J.1    Jura, J.2
  • 29
    • 0022704290 scopus 로고
    • Determination of the orientation distribution function from pole figures in arbitrarily defined cells
    • K. Pawlik Determination of the orientation distribution function from pole figures in arbitrarily defined cells Phys Stat Sol (b) 134 1986 477
    • (1986) Phys Stat Sol (B) , vol.134 , pp. 477
    • Pawlik, K.1
  • 30
    • 25644458757 scopus 로고
    • Theoretical methods of texture analysis
    • Bunge HJ, editor Clausthall-Zellerfield
    • Pawlik K, Pospiech J. Theoretical methods of texture analysis. In: Bunge HJ, editor. Proc Workshop, Clausthall-Zellerfield, 1986.
    • (1986) Proc Workshop
    • Pawlik, K.1    Pospiech, J.2
  • 31
    • 0003427458 scopus 로고
    • Addison-Wesley London
    • B.D. Cullity Elements of X-ray diffraction 1964 Addison-Wesley London Podstawy dyfrakcji promieni rentgenowskich (transl. from eng.); Warszawa: PWN
    • (1964) Elements of X-ray Diffraction
    • Cullity, B.D.1
  • 32
    • 36849124249 scopus 로고
    • A direct method of determining preferred orientation of a flat reflection sample using a Geiger counter X-ray spectrometer
    • L.G. Schulz A direct method of determining preferred orientation of a flat reflection sample using a Geiger counter X-ray spectrometer J Apply Phys 20 1949 1030 1033
    • (1949) J Apply Phys , vol.20 , pp. 1030-1033
    • Schulz, L.G.1
  • 33
    • 84985759881 scopus 로고
    • On the estimation of X-rays extinction changes due to randomly distributed dislocations in crystals
    • P. Klimanek, and K.H. Hanish On the estimation of X-rays extinction changes due to randomly distributed dislocations in crystals Crystal Res & Technol 18 3 1983 361 365
    • (1983) Crystal Res & Technol , vol.18 , Issue.3 , pp. 361-365
    • Klimanek, P.1    Hanish, K.H.2
  • 34
    • 0001948536 scopus 로고    scopus 로고
    • Secondary extinction correction used in pole density measurement by X-ray diffraction
    • I. Tomov, and K. Ivanova Secondary extinction correction used in pole density measurement by X-ray diffraction Textures Microstruct 26-27 1996 59 70
    • (1996) Textures Microstruct , vol.26-27 , pp. 59-70
    • Tomov, I.1    Ivanova, K.2
  • 35
    • 0000595206 scopus 로고    scopus 로고
    • Secondary extinction in textured films
    • V. Yamakov, and I. Tomov Secondary extinction in textured films J Appl Cryst 32 1999 300 308
    • (1999) J Appl Cryst , vol.32 , pp. 300-308
    • Yamakov, V.1    Tomov, I.2
  • 37
    • 0345554692 scopus 로고
    • Warszawa:PWN
    • Luger P. Rentgenografia strukturalna monokrysztalow. Warszawa:PWN; 1989 (transl. from eng. Modern X-ray analysis on single crystals. Berlin/New York: Ed. by Walter de Gruyter; 1989).
    • (1989) Rentgenografia Strukturalna Monokrysztalow
    • Luger, P.1
  • 38
    • 25644432979 scopus 로고
    • transl. from eng. Berlin/New York: Ed. by Walter de Gruyter
    • transl. from eng. Modern X-ray analysis on single crystals. Berlin/New York: Ed. by Walter de Gruyter; 1989)
    • (1989) Modern X-ray Analysis on Single Crystals
  • 42
    • 0001554893 scopus 로고
    • The secondary extinction correction
    • W.H. Zachariasen The secondary extinction correction Acta Cryst 16 1963 1139 1145
    • (1963) Acta Cryst , vol.16 , pp. 1139-1145
    • Zachariasen, W.H.1
  • 43
    • 0001688780 scopus 로고
    • Extinction in X-ray crystallography
    • S. Chandrasekhar Extinction in X-ray crystallography Adv Phys 9 1960 363 385
    • (1960) Adv Phys , vol.9 , pp. 363-385
    • Chandrasekhar, S.1
  • 45
    • 0006737647 scopus 로고
    • The effect of crystal shape and setting on secondary extinction
    • W.C. Hamilton The effect of crystal shape and setting on secondary extinction Acta Cryst 10 1957 629 631
    • (1957) Acta Cryst , vol.10 , pp. 629-631
    • Hamilton, W.C.1
  • 46
    • 0001612264 scopus 로고
    • Physikalische Grundlagen der quantitativen röntgenographischen Phasenanalyse (RPA)
    • G. Faninger, and U. Hartmann Physikalische Grundlagen der quantitativen röntgenographischen Phasenanalyse (RPA) Härt Techn Mitt 27 1972 233 244
    • (1972) Härt Techn Mitt , vol.27 , pp. 233-244
    • Faninger, G.1    Hartmann, U.2
  • 47
    • 25644444746 scopus 로고
    • PhD Thesis, AGH, Krakow
    • Bonarski J. PhD Thesis, AGH, Krakow, 1989.
    • (1989)
    • Bonarski, J.1
  • 49
    • 0030114418 scopus 로고    scopus 로고
    • Aapplication of linear regression method for the comparison of crystallographic textures
    • J. Tarasiuk, and K. Wierzbanowski Aapplication of linear regression method for the comparison of crystallographic textures Philos Mag A 73 1996 1083 1091
    • (1996) Philos Mag A , vol.73 , pp. 1083-1091
    • Tarasiuk, J.1    Wierzbanowski, K.2
  • 50
    • 25644442640 scopus 로고    scopus 로고
    • Private communication, Krakow
    • Jura J. Private communication, Krakow, 2001.
    • (2001)
    • Jura, J.1
  • 52
    • 0342732945 scopus 로고    scopus 로고
    • Texture organization into deposited Cu layers
    • Trans Tech Publ, Switzerland. Materials science forum
    • Bonarski J, Beltowska E, Swiatek Z. Texture organization into deposited Cu layers. In: Proc of EPDIC-6, Trans Tech Publ, Switzerland. Materials science forum 2000;321-324(Part I):411-6.
    • (2000) Proc of EPDIC-6 , vol.321-324 , Issue.1 PART , pp. 411-416
    • Bonarski, J.1    Beltowska, E.2    Swiatek, Z.3
  • 58
    • 0027635415 scopus 로고
    • X-ray diffraction texture analysis with a position sensitive detector
    • L. Wcislak, H.J. Bunge, and C.U. Nauer-Gerhardt X-ray diffraction texture analysis with a position sensitive detector Z Metall 84 1993 479 493
    • (1993) Z Metall , vol.84 , pp. 479-493
    • Wcislak, L.1    Bunge, H.J.2    Nauer-Gerhardt, C.U.3
  • 62
    • 25644441166 scopus 로고    scopus 로고
    • Private communication, Krakow
    • Pospiech J. Private communication, Krakow, 2000.
    • (2000)
    • Pospiech, J.1
  • 63
    • 0017984754 scopus 로고
    • X-ray polarization phenomena
    • M. Hart X-ray polarization phenomena Philos Mag B 38 1 1978 41 56
    • (1978) Philos Mag B , vol.38 , Issue.1 , pp. 41-56
    • Hart, M.1
  • 64
    • 25644432978 scopus 로고
    • The magneto X-ray Kerr effect in ferritic steel
    • J. Bonarski, and J. Karp The magneto X-ray Kerr effect in ferritic steel J Phys: Condens Matter 1 1989 9261 9266
    • (1989) J Phys: Condens Matter , vol.1 , pp. 9261-9266
    • Bonarski, J.1    Karp, J.2
  • 65
    • 0842324456 scopus 로고    scopus 로고
    • X-ray diffraction analysis of microstructure formation in electrodeposits
    • Montreal
    • Handreg I, Klimanek P, Lange G. X-ray diffraction analysis of microstructure formation in electrodeposits. Proc of ICOTOM-12, Montreal, 1999, p. 402-7.
    • (1999) Proc of ICOTOM-12 , pp. 402-407
    • Handreg, I.1    Klimanek, P.2    Lange, G.3
  • 66
    • 24944486305 scopus 로고    scopus 로고
    • Postdeposition relaxation of internal stress in sputter grown thin films caused by ion bombardment
    • R. Nowak, F. Yoshida, J. Morgiel, and B. Major Postdeposition relaxation of internal stress in sputter grown thin films caused by ion bombardment J Appl Phys 85 2 1999 1 12
    • (1999) J Appl Phys , vol.85 , Issue.2 , pp. 1-12
    • Nowak, R.1    Yoshida, F.2    Morgiel, J.3    Major, B.4
  • 67
    • 0003883476 scopus 로고    scopus 로고
    • Stainless steels
    • The Materials Information Society
    • Davis JR, editor. ASM specialty handbook. Stainless steels. The Materials Information Society; 1996.
    • (1996) ASM Specialty Handbook
    • Davis, J.R.1
  • 73
    • 20844444167 scopus 로고    scopus 로고
    • Thin layers of TiN fabricated on metallic titanium and polyurethane by pulsed laser deposition
    • B. Major, R. Ebner, T. Wierzchon, W. Mroz, W. Waldhauser, and R. Major Thin layers of TiN fabricated on metallic titanium and polyurethane by pulsed laser deposition Ann Transplantat 9 1A(Suppl.) 2004 30
    • (2004) Ann Transplantat , vol.9 , Issue.1 , pp. 30
    • Major, B.1    Ebner, R.2    Wierzchon, T.3    Mroz, W.4    Waldhauser, W.5    Major, R.6
  • 75
    • 25644460628 scopus 로고    scopus 로고
    • Biocompatibile TiN based coatings on metallic titanium substrate produced by laser ablation
    • R. Major, E. Czarnowska, A. Sowinska, R. Kustosz, J.M. Lackner, and W. Waldhauser Biocompatibile TiN based coatings on metallic titanium substrate produced by laser ablation Eng Biomater 38-42 2004 66 67
    • (2004) Eng Biomater , Issue.38-42 , pp. 66-67
    • Major, R.1    Czarnowska, E.2    Sowinska, A.3    Kustosz, R.4    Lackner, J.M.5    Waldhauser, W.6
  • 79
    • 1842593504 scopus 로고    scopus 로고
    • Progress in X-ray diffraction of residual macrostresses Determination related to surface layer gradients and anisotropy
    • S.J. Skrzypek, and A. Baczmanski Progress in X-ray diffraction of residual macrostresses Determination related to surface layer gradients and anisotropy Adv X-ray Anal 44 2001 134 145
    • (2001) Adv X-ray Anal , vol.44 , pp. 134-145
    • Skrzypek, S.J.1    Baczmanski, A.2
  • 80
    • 0034438951 scopus 로고    scopus 로고
    • Quantitative phase analysis of duplex stainless steel using incomplete pole figures
    • J. Bonarski, M. Wrobel, and K. Pawlik Quantitative phase analysis of duplex stainless steel using incomplete pole figures Mater Sci Technol 16 6 2000 657 662
    • (2000) Mater Sci Technol , vol.16 , Issue.6 , pp. 657-662
    • Bonarski, J.1    Wrobel, M.2    Pawlik, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.