Three-dimensional electrical property mapping with nanometer resolution

Advanced Materials

Volumn 21, Issue 48, 2009, Pages 4915-4919

  Alekseev, Alexander ^a,b   Efimov, Anton ^c   Lu, Kangbo ^a   Loos, Joachim ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b NT MDT   (Russian Federation)

^c SHUMAKOV NATIONAL MEDICAL RESEARCH CENTER OF TRANSPLANTOLOGY AND ARTIFICIAL ORGANS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE NETWORKS; ELECTRICAL CONDUCTION; ELECTRICAL PROPERTY; NANOMETER RESOLUTIONS; PERCOLATION THRESHOLDS; POLYMER NANOCOMPOSITE; THREE DIMENSIONS;

CARBON NANOTUBES; MULTIWALLED CARBON NANOTUBES (MWCN); NANOCOMPOSITES; SOLVENTS;

ELECTRIC PROPERTIES;

EID: 73949113189     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200901754     Document Type: Article

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