Corrigendum: Cathodoluminescence nano-characterization of semiconductors (Semiconductor Science and Technology (2011) 26 (064005) DOI: 10.1088/0268-1242/26/6/064005);Cathodoluminescence nano-characterization of semiconductors

Semiconductor Science and Technology

Volumn 26, Issue 6, 2011, Pages

  Edwards, Paul R ^a   Martin, Robert W ^a  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; HYPERSPECTRAL IMAGING; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY;

DESIGN CONSIDERATIONS; III-NITRIDE; NANO-CHARACTERIZATION; NANOSCALE CHARACTERIZATION; SEMICONDUCTING MATERIALS; SPATIAL RESOLUTION; TECHNICAL ASPECTS;

CHARACTERIZATION;

EID: 79953907367     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/1361-6641/aac678     Document Type: Erratum

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