Nanoparticles: Strained and stiff

Science

Volumn 305, Issue 5684, 2004, Pages 651-654

  Gilbert, Benjamin ^a   Huang, Feng ^a   Zhang, Hengzhong ^a   Waychunas, Glenn A ^b   Banfield, Jillian F ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

STIFFNESS; STRUCTURAL ANALYSIS; VIBRATION MEASUREMENT; ZINC SULFIDE;

NANOMETER; RADIAL COMPRESION; VIBRATION FREQUENCY;

NANOSTRUCTURED MATERIALS;

NANOPARTICLE; ZINC SULFIDE;

NANOTECHNOLOGY;

ARTICLE; COMPRESSION; FOURIER TRANSFORMATION; PARTICLE SIZE; PHASE TRANSITION; PRIORITY JOURNAL; SURFACE PROPERTY; TEMPERATURE DEPENDENCE; ULTRAVIOLET SPECTROSCOPY; VIBRATION; X RAY CRYSTALLOGRAPHY;

EID: 3442876401     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1098454     Document Type: Article

References (29)

1. R. Rossetti, R. Hull, J. M. Gibson, L. E. Brus, J. Chem. Phys. 82, 552 (1985).
2. C. B. Murray, D. J. Norris, M. G. Bawendi, J. Am. Chem Soc. 115, 8706 (1993).
3. A. P. Alivisatos, Science 271, 933 (1996).
4. L. E. Brus, J. Chem. Phys. 80, 4403 (1984).
5. P. E. Lippens, M. Lannoo. Phys. Rev. B 39, 10935 (1989).
6. A. Franceschetti, A. Zunger, Phys. Rev. Lett. 78, 915 (1997).
7. B. Palosz et al., Z. Kristallogr. 217, 497 (2002).
8. L.-W. Wang, A. Zunger, Phys. Rev. B 53, 9579 (1996).
9. K. Leung, K. B. Whaley, J. Chem. Phys. 110, 11012 (1999).
10. E. Rabani, J. Chem. Phys. 115, 1493 (2001),
11. A. Puzder, A. J. Williamson, F. A. Reboredo, G. Galli, Phys. Rev. Lett. 91, 157405 (2003).
12. H. Zhang, B. Gilbert, F. Huang, J. F. Banfield, Nature 424, 1025 (2003).
13. W. Vogel, P. H. Borse, N. Deshmukh, S. K. Kulkarni, Langmuir 16, 2032 (2000).
14. See supporting online material.
15. B. J. Thijsse, J. Appl. Crystallogr. 17, 61 (1984).
16. A. C. Wright et al., J. Non-Cryst. Solids 129, 213 (1991).
17. S. J. Billinge, M. F. Thorpe, Eds., Local Structure from Diffraction (Plenum, New York, 1998).
18. J. Rockenburger, et al. J. Chem. Phys. 108, 7807 (1998).
19. M. A. Marcus, W. Flood, M. Steigerwald, L. Brus, M. Bawendi. J. Phys. Chem. 95, 1S72 (1991).
20. A. C. Carter, et al., Phys. Rev. B 55, 13822 (1997).
21. M. G. Bawendi, A. R. Kortan, M. L. Seigerwald, L. E. Brus, J. Chem. Phys. 91, 7282 (1989).
22. G. Mason, Nature 217, 733 (1968).
23. I.-K. Jeong, Th. Proffen, F. Mohiuddin-Jacobs, S. J. L. Billinge, J. Phys. Chem. A 103, 921 (1999).
24. J.-J. Shiang, A. V. Kadavanich, R. K. Grubbs, A. P. Alivisatos, A. P. 1995. J. Phys. Chem. 99, 17417 (1995).
25. A. L. Ankudinov, B. Ravel, J. J. Rehr, S. D. Conradson, Phys. Rev. B 58, 7565 (1998).
26. A. I. Frenkel, J. J. Rehr, Phys. Rev B 48, 585 (1993).
27. G. Dalba, et al., Phys. Rev. B 58, 4793 (1998).
28. ZnS, then ωCdSe/ωZns| predicted = √μZnS/μCdSe = 0.68. In fact, ωCdSe/ωZnS| observed = √μZnS/μCdSe = 0.676. Hence, the results presented here for bulk ZnS and in (27) for bulk CdSe are in good agreement.
29. We thank M. Toney for discussion on PDF analysis, C. Kim for practical advice on EXAFS acquisition, and M. Zach for assistance with sample holder fabrication. SAXS data were acquired on beamline 1.4 at the Stanford Synchrotron Radiation Lab (SSRL), and we thank J. Pople. Zn K-edge EXAFS were acquired on beamline 4-3 at SSRL, and we thank M. Lattimer. WAXS data were acquired on beamline 11-ID-C at the Advanced Photon Source (APS), Argonne National Laboratory, and we thank Y. Ren and M. Beno. The U.S. Department of Energy, Office of Basic Energy Sciences, supports use of the APS (Contract No. W-31-109-Eng-38) and the SSRL (Contract No. DE-AC03-76SFOO515). HRTEM was performed at the National Center for Electron Microscopy, Berkeley, CA, and we thank C. Song. Financial support for this work came from the U.S. Department of Energy, the National Science Foundation, and Lawrence Berkeley National Laboratory.