Sub-Ångstrom Atomic-Resolution Imaging from Heavy Atoms to Light Atoms

Microscopy and Microanalysis

Volumn 10, Issue 1, 2004, Pages 86-95

  O'Keefe, Michael A ^a   Shao Horn, Yang ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Atomic resolution; Exit surface wave; FSR; HREM; Lithium battery; Sub ngstrom

Indexed keywords

CARBON; LITHIUM; NITROGEN; OXIDE; OXYGEN; TITANIUM;

ARTICLE; CHEMISTRY; ELECTRON MICROSCOPY; INSTRUMENTATION; METHODOLOGY;

CARBON; LITHIUM; MICROSCOPY, ELECTRON; NITROGEN; OXIDES; OXYGEN; TITANIUM;

EID: 1442338806     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S143192760404019X     Document Type: Conference Paper

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