Bringing the Nanolaboratory Inside Electron Microscopes

IEEE Nanotechnology Magazine

Volumn 2, Issue 2, 2008, Pages 18-31

  Fukuda, Toshio ^a   Nakajima, Masahiro ^a   Liu, Pou ^a   Ahmad, Mohd Ridzuan ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; ELECTRONS; MANIPULATORS; MICROMANIPULATORS; MICROSCOPES; MICROSCOPIC EXAMINATION; NANOROBOTICS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; ROBOTICS; SCANNING; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; THREE DIMENSIONAL; TRANSMISSION ELECTRON MICROSCOPY;

APPLICATIONS.; ATOMIC FORCE MICROSCOPY; MICROSCOPY; NANO ASSEMBLIES; NANO DEVICES; NANOBIOSCIENCE; NANOMANIPULATION; NANOROBOTIC MANIPULATION SYSTEMS; NANOROBOTIC MANIPULATIONS; NANOSCALE DEVICES; NANOSCALE FABRICATIONS; SCANNING ELECTRON MICROSCOPES; SINGLE CELLS; TRANSMISSION ELECTRON MICROSCOPES;

ELECTRON MICROSCOPES;

EID: 56049115378     PISSN: 19324510     EISSN: None     Source Type: Journal    
DOI: 10.1109/MNANO.2008.925517     Document Type: Article

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