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Volumn 82, Issue 21, 2003, Pages 3740-3742
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Surface energy maps of nanostructures: Atomic force microscopy and numerical simulation study
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
ETCHING;
IMAGE ANALYSIS;
IMAGING SYSTEMS;
INTERFACIAL ENERGY;
NANOSTRUCTURED MATERIALS;
RESONANCE;
ETCH PITS;
GRAPHITE;
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EID: 0037665889
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1577392 Document Type: Article |
Times cited : (32)
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References (23)
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