A combined SAXS/WAXS/XAFS setup capable of observing concurrent changes across the nano-to-micrometer size range in inorganic solid crystallization processes

Journal of the American Chemical Society

Volumn 128, Issue 38, 2006, Pages 12386-12387

  Beale, Andrew M ^a   Van Der Eerden, Ad M J ^a   Jacques, Simon D M ^b   Leynaud, Olivier ^b   O'Brien, Matthew G ^b   Meneau, Florian ^c   Nikitenko, Sergei ^c   Bras, Wim ^c   Weckhuysen, Bert M ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM PHOSPHATE; INORGANIC COMPOUND; NANOPARTICLE; ZINC;

ARTICLE; CRYSTAL; CRYSTALLIZATION; DATA ANALYSIS; MATERIALS; PARTICLE SIZE; RADIATION SCATTERING; REACTOR; SPECTROSCOPY; WIDE ANGLE X RAY SCATTERING; X RAY ABSORPTION FINE STRUCTURE; X RAY ABSORPTION NEAR EDGE SPECTROSCOPY; X RAY CRYSTALLOGRAPHY;

EID: 33749241749     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja062580r     Document Type: Article

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