Erratum: Mechanics of interaction and atomic-scale wear of amplitude modulation atomic force microscopy probes (ACS Nano (2013) 7 (3221-3235) DOI: 10.1021/nn305901n);Mechanics of interaction and atomic-scale wear of amplitude modulation atomic force microscopy probes

ACS Nano

Volumn 7, Issue 4, 2013, Pages 3221-3235

  Vahdat, Vahid ^a   Grierson, David S ^b   Turner, Kevin T ^a   Carpick, Robert W ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b University of Wisconsin Madison   (United States)

Author keywords

AM AFM; amplitude modulation; atomic scale wear; contact mechanics; contact stress; peak repulsive force; tapping mode

Indexed keywords

AMPLITUDE MODULATION; DIAMONDS; GEOMETRY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INDIUM COMPOUNDS; NITRIDES; PLASTIC COATINGS; PLASTIC DEFORMATION; PROBES; SCANNING ELECTRON MICROSCOPY; SILICON NITRIDE;

ATOMIC SCALE; CONTACT MECHANICS; CONTACT STRESS; REPULSIVE FORCES; TAPPING MODES;

ATOMIC FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; DEVICE FAILURE ANALYSIS; DEVICES; EQUIPMENT DESIGN; MECHANICAL STRESS; THEORETICAL MODEL; TRANSDUCER; ARTICLE; EQUIPMENT; EQUIPMENT FAILURE;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICROSCOPY, ATOMIC FORCE; MODELS, THEORETICAL; STRESS, MECHANICAL; TRANSDUCERS;

EID: 84876588620     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn405606y     Document Type: Erratum

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