Contamination-free transmission electron microscopy for high-resolution carbon elemental mapping of polymers

ACS Nano

Volumn 3, Issue 5, 2009, Pages 1297-1304

  Horiuchi, Shin ^a   Hanada, Takeshi ^b   Ebisawa, Masaharu ^b   Matsuda, Yasuhiro ^c   Kobayashi, Motoyasu ^c   Takahara, Atsushi ^c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b Consulting Zero Loss Imaging ^*  (Japan)

^c KYUSHU UNIVERSITY   (Japan)

Author keywords

Contamination; EFTEM; Elemental mapping; Polymer brush; Transmission electron microscopy

Indexed keywords

CARBON RICH; CARBONACEOUS COMPOUNDS; CHEMICAL OXIDATION; CONTAMINATION-FREE; DISTRIBUTED PARTICLES; EFTEM; ELECTRON BEAM IRRADIATION; ELECTRON SPECTROSCOPIC IMAGING; ELEMENTAL MAPPING; ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPIES; HIGH RESOLUTION; HIGH-RESOLUTION IMAGING; OXYGEN RADICAL; POLYMER BRUSH; POLYMER BRUSHES; POLYMER CHAINS; SILICA NANOPARTICLES; SOFT MATERIAL; TEM; TRANSMISSION ELECTRON MICROSCOPE;

BRUSHES; CONTAMINATION; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; HYDROCARBONS; OXYGEN; POLYMERS; SILICA;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

CARBON; POLYMER;

ARTICLE; ARTIFACT; CHEMISTRY; IMAGE ENHANCEMENT; METHODOLOGY; TRANSMISSION ELECTRON MICROSCOPY;

ARTIFACTS; CARBON; IMAGE ENHANCEMENT; MICROSCOPY, ELECTRON, TRANSMISSION; POLYMERS;

EID: 66949140341     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn9001598     Document Type: Article

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