Molecular scale energy dissipation in oligothiophene monolayers measured by dynamic force microscopy

Nanotechnology

Volumn 20, Issue 43, 2009, Pages

  Martínez, Nicolas F ^a   Kamiński, Wojciech ^b,c   Gómez, Carlos J ^a   Albonetti, Cristiano ^d   Biscarini, Fabio ^d   Pérez, Rubén ^c   García, Ricardo ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

^b UNIVERSITY OF WROC AW   (Poland)

^c UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^d CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CONFIGURATION SPACE; DYNAMIC FORCE MICROSCOPY; MOLECULAR GEOMETRIES; MOLECULAR SCALE; MOLECULAR SURFACES; OLIGOTHIOPHENES; SEXITHIOPHENES; THEORETICAL APPROACH;

ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; MONOLAYERS; WAVE FUNCTIONS;

ENERGY DISSIPATORS;

AMPLITUDE MODULATION; ARTICLE; ATOMIC FORCE MICROSCOPY; ENERGY TRANSFER; MOLECULAR DYNAMICS; NANOTECHNOLOGY; PRIORITY JOURNAL;

EID: 70349690316     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/43/434021     Document Type: Article

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