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Volumn 16, Issue 3, 2005, Pages
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Quantitative force measurements using frequency modulation atomic force microscopy - Theoretical foundations
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Author keywords
[No Author keywords available]
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Indexed keywords
CANTILEVER BEAMS;
FORCE MEASUREMENT;
FREQUENCY MODULATION;
FREQUENCY SHIFT KEYING;
NATURAL FREQUENCIES;
OSCILLATIONS;
DEFLECTION PROPERTIES;
DYNAMIC FORCE;
INTERACTION FORCE;
ATOMIC FORCE MICROSCOPY;
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EID: 15844390647
PISSN: 09574484
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-4484/16/3/018 Document Type: Conference Paper |
Times cited : (134)
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References (20)
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