Adhesion detachment and movement of gold nanoclusters induced by dynamic atomic force microscopy

Journal of Physics Condensed Matter

Volumn 20, Issue 35, 2008, Pages

  Paolicelli, G ^a   Mougin, K ^b   Vanossi, A ^c   Valeri, S ^c  

^a CNR Consiglio Nazionale delle Ricerche   (Italy)

^b INSTITUT DE CHIMIE DES SURFACES ET INTERFACES   (France)

^c UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; MODULATION; NANOCLUSTERS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; SCANNING PROBE MICROSCOPY; SILICON;

AMBIENT CONDITIONS; AMPLITUDE MODULATION AFM; CALIBRATION PROCEDURES; DYNAMIC ATOMIC FORCE MICROSCOPIES; FRICTIONAL PROPERTIES; GOLD NANOCLUSTERS; LENGTH SCALES; NANOMETER SCALES; OPERATIONAL METHODS; PHYSISORBED; SILICON SUBSTRATES; SIZE DEPENDENCES; SPATIAL DISPLACEMENTS; TO SWITCHES;

MICROSCOPIC EXAMINATION;

EID: 56349158393     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/20/35/354011     Document Type: Article

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