Ultrananocrystalline diamond tip integrated onto a heated atomic force microscope cantilever

Nanotechnology

Volumn 23, Issue 49, 2012, Pages

  Kim, Hoe Joon ^a   Moldovan, Nicolaie ^b   Felts, Jonathan R ^a   Somnath, Suhas ^a   Dai, Zhenting ^a   Jacobs, Tevis D B ^c   Carpick, Robert W ^c   Carlisle, John A ^b   King, William P ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b ADVANCED DIAMOND TECHNOLOGIES INC   (United States)

^c UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM CANTILEVERS; ATOMIC FORCE MICROSCOPE CANTILEVERS; CONTACT MODES; DIAMOND TIP; IMAGING RESOLUTIONS; INTERMITTENT CONTACT MODES; POTENTIAL APPLICATIONS; SILICON TIPS; SINGLE CRYSTAL SILICON; ULTRA-NANOCRYSTALLINE DIAMOND; WEAR-RESISTANT;

INFRARED IMAGING; NANOCANTILEVERS; SILICON;

ATOMIC FORCE MICROSCOPY;

DIAMOND; NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CRYSTALLIZATION; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; HEATING; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; SYSTEM ANALYSIS; TRANSDUCER; ULTRASTRUCTURE;

CRYSTALLIZATION; DIAMOND; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; HEATING; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; NANOTECHNOLOGY; SYSTEMS INTEGRATION; TRANSDUCERS;

EID: 84870011585     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/49/495302     Document Type: Article

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