Electrical characterization of Au/ZnO/TiO2/n-Si and (Ni/Au)/ZnO/TiO2/n-Si Schottky diodes by using currentvoltage measurements

Journal of Optoelectronics and Advanced Materials

Volumn 14, Issue 11-12, 2012, Pages 959-963

  Kinaci, B ^a   Asar, T ^a   Cetin S S ^a   Ozen Y ^a   Kizilkaya, K ^a  

^a GAZI UNIVERSITY   (Turkey)

Author keywords

Current voltage characteristics; DC magnetron sputtering; Scothky diodes; ZnO

Indexed keywords

BIAS VOLTAGE; CURRENT VOLTAGE CHARACTERISTICS; DIODES; ELECTRIC RECTIFIERS; ELECTRIC RESISTANCE; II-VI SEMICONDUCTORS; INTERFACE STATES; MAGNETRON SPUTTERING; OXIDE MINERALS; SILICON; SILICON COMPOUNDS; TITANIUM COMPOUNDS; ZINC OXIDE;

CURRENT-VOLTAGE MEASUREMENTS; DC MAGNETRON SPUTTERING; DC MAGNETRON SPUTTERING SYSTEMS; EFFECTIVE BARRIER HEIGHTS; ELECTRICAL CHARACTERIZATION; ELECTRICAL PARAMETER; ENERGY DISTRIBUTIONS; SERIES RESISTANCES;

SCHOTTKY BARRIER DIODES;

EID: 84872109025     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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