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Volumn 83, Issue 12, 2009, Pages 1470-1474

Determination of the laterally homogeneous barrier height of metal/p-InP Schottky barrier diodes

Author keywords

InP semiconductor; Metal semiconductor metal contacts; Schottky barrier inhomogeneity; Schottky diodes

Indexed keywords

BARRIER HEIGHTS; CURRENT TRANSPORT; DIODE PARAMETERS; EXPERIMENTAL DATA; FITTING PARAMETERS; IDEALITY FACTORS; INHOMOGENEITIES; INP; INP SEMICONDUCTOR; LATERAL INHOMOGENEITY; LINEAR RELATIONSHIPS; METAL DEPOSITION; METAL-INDUCED GAP STATE; METAL-SEMICONDUCTOR CONTACTS; METAL-SEMICONDUCTOR-METAL CONTACTS; SCHOTTKY BARRIER INHOMOGENEITY; SCHOTTKY BARRIERS; SCHOTTKY CONTACTS; SCHOTTKY DIODES; VACUUM CONDITION;

EID: 67650707896     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2009.06.050     Document Type: Article
Times cited : (26)

References (44)
  • 1
    • 67650755720 scopus 로고    scopus 로고
    • Rhoderick EH, Williams RH. Metal-semiconductor contacts, Clarendon Press, Oxford
    • Rhoderick EH, Williams RH. Metal-semiconductor contacts, Clarendon Press, Oxford.
  • 32
    • 0026407696 scopus 로고
    • Indium phosphide and related materials
    • doi: 10.1109/ICIPRM.1991.147431
    • Shi ZQ, Anderson WA. Indium phosphide and related materials. In: Third International Conference; 1991. p. 535-538. doi: 10.1109/ICIPRM.1991.147431.
    • (1991) Third International Conference , pp. 535-538
    • Shi, Z.Q.1    Anderson, W.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.