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Volumn 83, Issue 12, 2009, Pages 1470-1474
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Determination of the laterally homogeneous barrier height of metal/p-InP Schottky barrier diodes
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Author keywords
InP semiconductor; Metal semiconductor metal contacts; Schottky barrier inhomogeneity; Schottky diodes
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Indexed keywords
BARRIER HEIGHTS;
CURRENT TRANSPORT;
DIODE PARAMETERS;
EXPERIMENTAL DATA;
FITTING PARAMETERS;
IDEALITY FACTORS;
INHOMOGENEITIES;
INP;
INP SEMICONDUCTOR;
LATERAL INHOMOGENEITY;
LINEAR RELATIONSHIPS;
METAL DEPOSITION;
METAL-INDUCED GAP STATE;
METAL-SEMICONDUCTOR CONTACTS;
METAL-SEMICONDUCTOR-METAL CONTACTS;
SCHOTTKY BARRIER INHOMOGENEITY;
SCHOTTKY BARRIERS;
SCHOTTKY CONTACTS;
SCHOTTKY DIODES;
VACUUM CONDITION;
CHEMICAL BONDS;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC POTENTIAL;
ELECTRONEGATIVITY;
LEAD;
METALS;
PHOTODETECTORS;
SEMICONDUCTOR DIODES;
THERMIONIC EMISSION;
TIN;
VACUUM DEPOSITION;
ZINC;
SCHOTTKY BARRIER DIODES;
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EID: 67650707896
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2009.06.050 Document Type: Article |
Times cited : (26)
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References (44)
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