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Volumn 87, Issue 10, 2010, Pages 1935-1940

Effect of series resistance on the electrical characteristics and interface state energy distributions of Sn/p-Si (MS) Schottky diodes

(1) Karataş, Şükrü a

a KAHRAMANMARAS SUTCU IMAM UNIVERSITY (Turkey)

Author keywords

Barrier height; Ideality factor; Interface state density; MS contact; Series resistance; Si

Indexed keywords

BIAS VOLTAGE; CAPACITANCE; DIODES; ELECTRIC RESISTANCE; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON; SEMICONDUCTOR DIODES; SILICON; TIN;

BARRIER HEIGHTS; IDEALITY FACTORS; INTERFACE STATE DENSITY; MS CONTACTS; SERIES RESISTANCES;

INTERFACE STATES;

EID: 79958018767 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/j.mee.2009.11.168 Document Type: Article

Times cited : (55)

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