A position-sensitive, single-photon detector with enhanced NIR response

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2011, Pages 5-11

  Stellari, Franco ^a   Song, Peilin ^a   Weger, Alan J ^a   Nakamura, Tomonori ^b,c   Kim, Stanley ^b,c   Roche, Robert ^b,c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b CENTRAL RESEARCH LABORATORY   (Japan)

^c NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED ANALYSIS; LOCALIZATION TECHNIQUE; LOW VOLTAGES; NEAR INFRA RED; PICOSECONDS; POSITION SENSITIVE; POWER SUPPLY VOLTAGE; SINGLE PHOTON AVALANCHE DIODE; SINGLE-PHOTON DETECTORS; SOI TECHNOLOGY; TEST CHIPS; TIME-RESOLVED EMISSIONS;

CAMERAS; ELECTRIC NETWORK ANALYSIS; FAILURE ANALYSIS; INFRARED DEVICES; PHOTODETECTORS; PHOTONS;

PARTICLE BEAMS;

EID: 84869015806     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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