Time resolved imaging at low power supply on 45nm technology

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2011, Pages

  Bascoul, G ^a   Perdu, P ^a   Celi, G ^b   Dudit, S ^b   Lewis, D ^c  

^a CNES   (France)

^b STMICROELECTRONICS   (France)

^c UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

45NM TECHNOLOGY; CMOS TECHNOLOGY; LOW POWER SUPPLY; LOW POWER SUPPLY VOLTAGE; PHOTON EMISSIONS; REALTIME IMAGING; SATURATION MODE; TIME RESOLVED IMAGING;

CMOS INTEGRATED CIRCUITS;

EID: 80052617773     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPFA.2011.5992726     Document Type: Conference Paper

References (12)

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