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Volumn 24, Issue 13, 2012, Pages 1675-1692

Development and application of multiple-probe scanning probe microscopes

Author keywords

carbon nanotubes; graphene; multiple probe atomic force microscope; multiple probe scanning tunneling microscope; nanoscale electrical conductivity

Indexed keywords

ADVANCED MATERIALS; AFM; AFM IMAGE; ATOMIC FORCE MICROSCOPE (AFM); ELECTRICAL CONDUCTIVITY; ELECTRICAL CONDUCTIVITY MEASUREMENTS; ELECTRICAL CONTACTS; FORCE SENSING; FOUR-PROBE; HIGH RESOLUTION; INSULATING SUBSTRATES; METAL NANOWIRE; MOLECULAR FILMS; MULTIPLE-PROBE ATOMIC FORCE MICROSCOPE; MULTIPLE-PROBE SCANNING TUNNELING MICROSCOPE; NANO SCALE; NANOSCIENCE AND NANOTECHNOLOGIES; SCANNING PROBE MICROSCOPE; SCANNING TUNNELING MICROSCOPES;

EID: 84859152227     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201200257     Document Type: Article
Times cited : (59)

References (89)
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    • Interconnect chapter
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.