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Japanese Journal of Applied Physics, Part 2: Letters

Volumn 44, Issue 1-7, 2005, Pages

Construction of independently driven double-tip scanning tunneling microscope

(5) Takami, Kazuhiro a Akai Kasaya, Megumi a,b Saito, Akira a,b,c Aono, Masakazu a,b,d Kuwahara, Yuji a,b,c

a OSAKA UNIVERSITY (Japan)

b Japan Science and Technology Agency (Japan)

c RIKEN HARIMA INSTITUTE (Japan)

d NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

Electric conduction; Independently driven double tip scanning tunneling microscope; Micrometer scale; Nanostructure; Poly(3 octylthlophene); Resistivity; Scanning tunneling microscope

Indexed keywords

BANDWIDTH; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRODES; LITHOGRAPHY; NANOSTRUCTURED MATERIALS; PIEZOELECTRIC DEVICES; PIEZOELECTRICITY; THIN FILMS; ULTRAHIGH VACUUM;

ELECTRIC CONDUCTION; INDEPENDENTLY DRIVEN DOUBLE-TIP SCANNING TUNNELING MICROSCOPES; MICROMETER SCALES; NANOSTRUCTURES; POLY(3-OCTYLTHIOPHENE); RESISTIVITY; SCANNING TUNNELING MICROSCOPES;

SCANNING TUNNELING MICROSCOPY;

EID: 17444392886 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.44.L120 Document Type: Article

Times cited : (38)

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