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Volumn 82, Issue 4, 2011, Pages

Angled long tip to tuning fork probes for atomic force microscopy in various environments

(7) Higuchi, Seiji a,b,c Kuramochi, Hiromi a Kubo, Osamu a Masuda, Shintaro b Shingaya, Yoshitaka a Aono, Masakazu a Nakayama, Tomonobu a,c

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

b HORIBA LTD (Japan)

c UNIVERSITY OF TSUKUBA (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM IMAGE; AIR SHOWS; ATOMIC STEP; EXCITATION FREQUENCY; FLEXURAL MODES; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY; HIGHER ORDER; HIGHLY ORIENTED PYROLYTIC GRAPHITE; HYDRODYNAMIC DAMPING; METAL TIP; OSCILLATORY BEHAVIORS; RESONANCE FREQUENCIES; SCANNING ELECTRON MICROSCOPE; TIP APEX; TUNING FORKS;

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; PROBES; PYROLYSIS; RESONANCE; SCANNING ELECTRON MICROSCOPY; TUNING;

FREQUENCY MODULATION;

EID: 79955579235 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3569765 Document Type: Article

Times cited : (19)

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