Stability, resolution, and tip-tip imaging by a dual-probe scanning tunneling microscope

Review of Scientific Instruments

Volumn 72, Issue 12, 2001, Pages 4388-4392

  Grube, Holger ^a   Harrison, B Craig ^a   Jia, Jinfeng ^a   Boland, John J ^a  

^a University of North Carolina at Chapel Hill   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035677076     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1416120     Document Type: Article

References (8)

1. G. Binning, H. Rohrer, C. Gerber, and E. Weibel, Phys. Rev. Lett. 49, 57 (1982).
2. Y. S. Chang and E. J. Heller, Phys. Rev. Lett. 78, 2570 (1997).
3. J. M. Byers and M. E. Flatte, Phys. Rev. Lett. 74, 306 (1995).
4. J. M. Beyers and M. E. Flatte, J. Phys. Chem. Solids 6, 1701 (1995).
5. Q. Niu, M. C. Chang, and C. K. Shih, Phys. Rev. B 51, 5502 (1995).
6. S. Tsukamoto, B. Siu, and N. Nakagiri, Rev. Sci. Instrum. 62, 1767 (1991).
7. P. Boggild, T. Hansen, O. Kuhn, and F. Grey, Rev. Sci. Instrum. 71, 2781 (2000).
8. H. Watanabe, C. Manabe, T. Shigematsu, and M. Shimizu, Appl. Phys. Lett. 78, 2928 (1997).