Four-point probe resistance measurements using ptlr-coated carbon nanotube tips

Nano Letters

Volumn 7, Issue 4, 2007, Pages 956-959

  Yoshimoto, Shinya ^a   Murata, Yuya ^b   Kubo, Keisuke ^a   Tomita, Kazuhiro ^b   Motoyoshi, Kenji ^b   Kimura, Takehiko ^b   Okino, Hiroyuki ^a   Hobara, Rei ^a   Matsuda, Iwao ^a   Honda, Shin Ichi ^b   Katayama, Mitsuhiro ^b   Hasegawa, Shuji ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COATING TECHNIQUES; COBALT COMPOUNDS; ELECTRIC CONDUCTIVITY; MEASUREMENT THEORY; NANOWIRES; SCANNING TUNNELING MICROSCOPY;

DIFFUSIVE TRANSPORT; PROBE RESISTANCES; PROBE-SPACING DEPENDENCE; PTLR-COATED CARBON NANOTUBE (CNT);

CARBON NANOTUBES;

CARBON NANOTUBE; IRIDIUM; PLATINUM;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; IMPEDANCE; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; MICROELECTRODE; ULTRASTRUCTURE;

ELECTRIC IMPEDANCE; ELECTROCHEMISTRY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IRIDIUM; MATERIALS TESTING; MICROELECTRODES; NANOTUBES, CARBON; PLATINUM;

EID: 34248178956     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0630182     Document Type: Article

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