Symmetrically arranged quartz tuning fork with soft cantilever for intermittent contact mode atomic force microscopy

Review of Scientific Instruments

Volumn 74, Issue 1 I, 2003, Pages 112-117

  Akiyama, T ^a   Staufer, U ^a   De Rooij, N F ^a   Frederix, P ^b   Engel, A ^b  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER BEAMS; FABRICATION; FINITE ELEMENT METHOD; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OSCILLATIONS; PIEZOELECTRICITY; QUARTZ; RESONANCE; SENSORS; TUNING;

INTERMITTENT CONTACT MODES; TUNING FORKS;

ATOMIC FORCE MICROSCOPY;

EID: 0037285923     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1523631     Document Type: Article

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