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Volumn 46, Issue 8 B, 2007, Pages 5636-5638

Multi-probe atomic force microscopy with optical beam deflection method

Author keywords

Frequency modulation detection; Multi probe atomic force microscopy; Optical beam deflection

Indexed keywords

CANTILEVER BEAMS; FREQUENCY MODULATION; IMAGE ANALYSIS;

FREQUENCY MODULATION DETECTION; MULTI-PROBE ATOMIC FORCE MICROSCOPY; OPTICAL BEAM DEFLECTION;

ATOMIC FORCE MICROSCOPY;

EID: 34548234492 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.46.5636 Document Type: Article

Times cited : (19)

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