Independently driven four-tip probes for conductivity measurements in ultrahigh vacuum

Surface Science

Volumn 493, Issue 1-3, 2001, Pages 633-643

  Shiraki, Ichiro ^a,b   Tanabe, Fuhito ^a   Hobara, Rei ^a   Nagao, Tadaaki ^a,c   Hasegawa, Shuji ^a,c  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SOCIETY FOR THE PROMOTION OF SCIENCE   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Scanning electron microscopy (SEM); Silicon; Surface electrical transport (surface conductivity, surface recombination, etc.)

Indexed keywords

ACTUATORS; CRYSTALS; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; PIEZOELECTRIC MATERIALS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA;

SURFACE ELECTRICAL TRANSPORT;

SEMICONDUCTING SILICON;

EID: 0035500583     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01276-6     Document Type: Conference Paper

References (7)