One-dimensional Schottky contact between ErSi2 nanowire and Si(001)

Applied Physics Letters

Volumn 88, Issue 23, 2006, Pages

  Kubo, O ^a,b   Shingaya, Y ^a,b   Aono, M ^a,b   Nakayama, T ^a,b,c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; ERBIUM ALLOYS; SCANNING TUNNELING MICROSCOPY; SCHOTTKY BARRIER DIODES; SILICON;

NANOWIRES (NW); SCHOTTKY CONTACT; SCHOTTKY EQUATION;

NANOSTRUCTURED MATERIALS;

EID: 33745053574     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2207492     Document Type: Article

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