Conductivity measurement of polydiacetylene thin films by double-tip scanning tunneling microscopy

Journal of Physical Chemistry B

Volumn 108, Issue 42, 2004, Pages 16353-16356

  Takami, Kazuhiro ^a   Mizuno, Jun ^a   Akai Kasaya, Megumi ^a,b   Saito, Akira ^a,b,c   Aono, Masakazu ^a,b,d   Kuwahara, Yuji ^a,b,c,d  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY; LANGMUIR BLODGETT FILMS; NANOTECHNOLOGY; PERSONAL DIGITAL ASSISTANTS; SCANNING TUNNELING MICROSCOPY; ULTRAVIOLET RADIATION;

CONDUCTING POLYMERS; DENSITY OF STATES; DOMAIN BOUNDARIES; MOLECULAR WIRES;

THIN FILMS;

EID: 7544239153     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp047177q     Document Type: Article

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