Dual-probe scanning tunneling microscope: Measuring a carbon nanotube ring transistor

Applied Physics Letters

Volumn 78, Issue 19, 2001, Pages 2928-2930

  Watanabe, Hiroyuki ^a   Manabe, Chikara ^a   Shigematsu, Taishi ^a   Shimizu, Masaaki ^a  

^a FUJI XEROX CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035821116     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1371529     Document Type: Article

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