Development and performance of the nanoworkbench: A four tip STM for conductivity measurements down to submicrometer scales

Review of Scientific Instruments

Volumn 76, Issue 4, 2005, Pages

  Guise, Olivier ^a   Marbach, Hubertus ^a,c   Yates Jr , John T ^a   Jung, Moon Chul ^a   Levy, Jeremy ^a   Ahner, Joachim ^b  

^a UNIVERSITY OF PITTSBURGH   (United States)

^b SEAGATE TECHNOLOGY   (United States)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVITY MEASUREMENTS; LOCALIZATION; NANOWORKBENCH; SUBMICROMETER SCALES;

AUGER ELECTRON SPECTROSCOPY; ELECTRIC CONDUCTIVITY; GROWTH (MATERIALS); IMAGING TECHNIQUES; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; SCANNING ELECTRON MICROSCOPY; SILICON ON INSULATOR TECHNOLOGY; ULTRAHIGH VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

SCANNING TUNNELING MICROSCOPY;

EID: 17644381907     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1878213     Document Type: Article

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