Multiple-scanning-probe tunneling microscope with nanoscale positional recognition function

Review of Scientific Instruments

Volumn 81, Issue 7, 2010, Pages

  Higuchi, Seiji ^a,b,c   Kuramochi, Hiromi ^a   Laurent, Olivier ^b   Komatsubara, Takashi ^b   MacHida, Shinichi ^a   Aono, Masakazu ^a   Obori, Kenichi ^b   Nakayama, Tomonobu ^a,c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b HORIBA LTD   (Japan)

^c UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL MEASUREMENT; FOUR-PROBE; NANO SCALE; PROBE MICROSCOPE; PROBE POSITION; RELATIVE POSITIONS; SCANNING METHODS; SUBMICROMETERS; TUNNELING MICROSCOPES;

MICROSCOPES; NANOSTRUCTURED MATERIALS; SCANNING;

PROBES;

EID: 77957111765     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3456990     Document Type: Article

References (16)

1. M. Aono, C. S. Jiang, T. Nakayama, T. Okuda, S. Qiao, M. Sakurai, C. Thirstrup, and Z. -H. Wu, Oyo Butsuri OYBSA9 0369-8009 67, 1361 (1998) (in Japanese).
2. H. Watanabe, C. Manabe, T. Shigematsu, and M. Shimizu, Appl. Phys. Lett. APPLAB 0003-6951 78, 2928 (2001). 10.1063/1.1371529
3. I. Shiraki, F. Tanabe, R. Hobara, T. Nagao, and S. Hasegawa, Surf. Sci. SUSCAS 0039-6028 493, 633 (2001). 10.1016/S0039-6028(01)01276-6 (Pubitemid 32943533)
4. H. Grube, B. C. Harrison, J. Jia, and J. J. Boland, Rev. Sci. Instrum. RSINAK 0034-6748 72, 4388 (2001). 10.1063/1.1416120 (Pubitemid 34046856)
5. H. Okamoto and D. M. Chen, Rev. Sci. Instrum. RSINAK 0034-6748 72, 4398 (2001). 10.1063/1.1416113 (Pubitemid 34046858)
6. K. Takami, M. Akai-Kasaya, A. Saito, M. Aono, and Y. Kuwahara, Jpn. J. Appl. Phys., Part 2 JAPLD8 0021-4922 44, L120 (2005). 10.1143/JJAP.44.L120 (Pubitemid 40540783)
7. O. Guise, H. Marbach, J. T. Yates, Jr., M. C. Jung, J. Levy, and J. Ahner, Rev. Sci. Instrum. RSINAK 0034-6748 76, 045107 (2005). 10.1063/1.1878213 (Pubitemid 40565043)
8. R. Hobara, N. Nagamura, S. Hasegawa, I. Matsuda, Y. Yamamoto, Y. Miyatake, and T. Nagamura, Rev. Sci. Instrum. RSINAK 0034-6748 78, 053705 (2007). 10.1063/1.2735593 (Pubitemid 46878464)
9. T. -H. Kim, Z. Wang, J. F. Wendelken, H. H. Weitering, W. Li, and A. P. Li, Rev. Sci. Instrum. RSINAK 0034-6748 78, 123701 (2007). 10.1063/1.2821610
10. O. Kubo, Y. Shingaya, M. Nakaya, M. Aono, and T. Nakayama, Appl. Phys. Lett. APPLAB 0003-6951 88, 254101 (2006). 10.1063/1.2213954 (Pubitemid 43954851)
11. D. -K. Lim, O. Kubo, Y. Shingaya, T. Nakayama, Y. -H. Kim, J. -Y. Lee, M. Aono, H. Lee, D. Lee, and S. Kim, Appl. Phys. Lett. APPLAB 0003-6951 92, 203114 (2008). 10.1063/1.2935329 (Pubitemid 351733932)
12. J. Onoe, T. Nakayama, M. Aono, and T. Hara, Appl. Phys. Lett. APPLAB 0003-6951 82, 595 (2003). 10.1063/1.1542943
13. S. Higuchi, O. Laurent, K. Obori, and T. Nakayama, IEEJ Transactions on Electronics, Information and Systems 127, 1314 (2007) (in Japanese). 0306-4379 10.1541/ieejeiss.127.1314 (Pubitemid 47436849)
14. J. C. Russ, The Image Processing Handbook, 3rd ed. (CRC, Springer, 1999), pp. 365-370.
15. M. Plaschke, J. Romer, and J. I. Kim, Ultramicroscopy ULTRD6 0304-3991 75, 77 (1998). 10.1016/S0304-3991(98)00053-9 (Pubitemid 28529693)
16. B. A. Mantooth, Z. J. Donhauser, K. F. Kelly, and P. S. Weiss, Rev. Sci. Instrum. RSINAK 0034-6748 73, 313 (2002). 10.1063/1.1427417 (Pubitemid 34192524)