Visualization of the local carrier dynamics in an InGaN quantum well using dual-probe scanning near-field optical microscopy

Applied Physics Express

Volumn 3, Issue 10, 2010, Pages

  Kaneta, Akio ^a   Hashimoto, Tsuneaki ^a   Nishimura, Katsuhito ^a   Funato, Mitsuru ^a   Kawakami, Yoichi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER DYNAMICS; INGAN QUANTUM WELLS; PHOTONIC MATERIALS; POTENTIAL DISTRIBUTIONS; ROUNDABOUT ROUTE; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SINGLE QUANTUM WELL; SNOM TECHNIQUE;

OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; OPTICAL WAVEGUIDES; PROBES; SEMICONDUCTOR QUANTUM WELLS; VISUALIZATION;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 78549295864     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.3.102102     Document Type: Article

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