Stable atomic imaging of Si(1 1 1)-7 × 7 surface by scanning tunneling microscope with carbon nanotube tip

Surface Science

Volumn 486, Issue 3, 2001, Pages

  Shimizu, Tetsuo ^a   Tokumoto, Hiroshi ^a   Akita, Seiji ^b   Nakayama, Yoshikazu ^b  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

^b Osaka Prefecture University   (Japan)

Author keywords

Carbon; Scanning tunneling microscopy; Silicon

Indexed keywords

ANNEALING; IMAGE ANALYSIS; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; SCANNING TUNNELING MICROSCOPY; SILICON;

ULTRA-HIGH VACUUM (UHV) ENVIRONMENT;

CARBON NANOTUBES;

EID: 0035838294     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01119-0     Document Type: Article

References (23)