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Volumn 115, Issue 35, 2011, Pages 17452-17463

Low-energy electron-induced decomposition and reactions of adsorbed tetrakis(trifluorophosphine)platinum [Pt(PF3)4]

Author keywords

[No Author keywords available]

Indexed keywords

BACKGROUND GAS; BOND CLEAVAGES; CLEAVAGE EVENTS; CO-ORDINATIVELY UNSATURATED; CROSS SECTION; DECOMPOSITION PROCESS; DEPOSITION CONDITIONS; ELECTRON BEAM-INDUCED DEPOSITION; ELECTRON FLUX; GASPHASE; HIGH-RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; IN-SITU; INCIDENT ELECTRONS; INITIAL DEPOSITIONS; LOW ENERGIES; NANOMETER-THICK FILMS; OXYGEN UPTAKE; PHOSPHORUS ATOM; ROOM TEMPERATURE; SECOND PHASE; SUBSTRATE TEMPERATURE; TETRAKIS;

EID: 80052328279     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp204189k     Document Type: Article
Times cited : (62)

References (81)
  • 8
    • 80052315036 scopus 로고    scopus 로고
    • Electron-Beam ULSI Applications
    • In, 2 nd ed. Helbert, J. N. Noyes Publications/William Andrew Publishing: New York, Chapter 7
    • Lepore, A. Electron-Beam ULSI Applications. In Handbook of VLSI Microlithography: Principles, Technology and Applications, 2 nd ed.; Helbert, J. N., Ed.; Noyes Publications/William Andrew Publishing: New York, 2001; Chapter 7, pp 670-755.
    • (2001) Handbook of VLSI Microlithography: Principles, Technology and Applications , pp. 670-755
    • Lepore, A.1
  • 9
    • 63649110675 scopus 로고    scopus 로고
    • SPIE/Wiley Interscience: New York.
    • Bakshi, V. EUV Lithography; SPIE/Wiley Interscience: New York, 2009.
    • (2009) EUV Lithography
    • Bakshi, V.1
  • 73
    • 77951001175 scopus 로고
    • 3 rd ed. Harper International: New York.
    • Huuheey, J. E. Inorgic Chemistry, 3 rd ed.; Harper International: New York, 1983.
    • (1983) Inorgic Chemistry
    • Huuheey, J.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.