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Volumn 97, Issue 22, 2010, Pages

Effect of top metal contact on electrical transport through individual multiwalled carbon nanotubes

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT-VOLTAGE MEASUREMENTS; ELECTRICAL PROPERTY; ELECTRICAL TRANSPORT; GAS INJECTION SYSTEM; IN-SITU; METAL CONTACTS; SCANNING ELECTRON MICROSCOPE; TOP CONTACT;

EID: 78650641169     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3518063     Document Type: Article
Times cited : (12)

References (10)
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  • 6
    • 0032511085 scopus 로고    scopus 로고
    • Carbon nanotube quantum resistors
    • DOI 10.1126/science.280.5370.1744
    • S. Frank, P. Poncharal, Z. L. Wang, and W. A. de Heer, Science SCIEAS 0036-8075 280, 1744 (1998). 10.1126/science.280.5370.1744 (Pubitemid 28283496)
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  • 9
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    • DOI 10.1002/adfm.200500215
    • M. Wang, J. Wang, Q. Chen, and L. M. Peng, Adv. Funct. Mater. AFMDC6 1616-301X 15, 1825 (2005). 10.1002/adfm.200500215 (Pubitemid 41609644)
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  • 10
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    • 10.1039/b9nr00127a
    • F. Banhart, Nanoscale 1, 201 (2009). 10.1039/b9nr00127a
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.