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Volumn 27, Issue 6, 2010, Pages 446-454

Multiple gate field-effect transistors for future cmos technologies

Author keywords

CMOS scaling; Double gate MOSFET; FinFET; Multigate FET; Multiple gate FET

Indexed keywords

CMOS SCALING; DOUBLE GATE MOSFET; FINFET; MULTIGATE FET; MULTIPLE GATES;

EID: 78649760383     PISSN: 02564602     EISSN: 09745971     Source Type: Journal    
DOI: 10.4103/0256-4602.72582     Document Type: Article
Times cited : (39)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.