Design and performance of a programmable-temperature scanning tunneling microscope

Review of Scientific Instruments

Volumn 69, Issue 5, 1998, Pages 2072-2080

  Hoogeman, M S ^a   Glastra Van Loon, D ^a   Loos, R W M ^a   Ficke, H G ^a   De Haas, E ^a   Van Der Linden, J J ^a   Zeijlemaker, H ^a   Kuipers, L ^a,c   Chang, M F ^a   Klik, M A J ^a   Frenken, J W M ^a,b  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b LEIDEN UNIVERSITY   (Netherlands)

^c UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11644254690     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148901     Document Type: Article

References (29)

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23. We used a PIC 151, UHV compatable, piezostack of Physik Instrumente (PI) GmbH & Co., Polytec-Platz 5-7, 76337 Waldbronn, Germany.
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