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Volumn 68, Issue 11, 1997, Pages 4155-4162

Microelectromechanical scanning probe instruments for array architectures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000101357     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.1148361     Document Type: Article
Times cited : (54)

References (24)
  • 2
    • 0003832849 scopus 로고
    • edited by J. A. Stroscio and W. J. Kaiser, (Academic, Boston)
    • Scanning Tunneling Microscopy, edited by J. A. Stroscio and W. J. Kaiser (Academic, Boston, 1993).
    • (1993) Scanning Tunneling Microscopy
  • 4
    • 0004198902 scopus 로고
    • edited by C. R. K. Marrian, (SPIE, Bellingham, Washington)
    • Technology of Proximal Probe Lithography, edited by C. R. K. Marrian (SPIE, Bellingham, Washington, 1993).
    • (1993) Technology of Proximal Probe Lithography


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.