High performance feedback for fast scanning atomic force microscopes

Review of Scientific Instruments

Volumn 72, Issue 8, 2001, Pages 3320-3327

  Schitter, G ^a   Menold, P ^b   Knapp, H F ^a,c   Allgower F ^b   Stemmer, A ^b  

^a ETH ZURICH   (Switzerland)

^b UNIVERSITY OF STUTTGART   (Germany)

^c CSEM   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035419646     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1387253     Document Type: Article

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