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Volumn 68, Issue 7, 1997, Pages 2790-2796
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An ultrahigh vacuum high speed scanning tunneling microscope
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
AMPLIFIERS (ELECTRONIC);
COMPUTER CONTROL;
DATA ACQUISITION;
FEEDBACK CONTROL;
GOLD;
IMAGE RECONSTRUCTION;
NICKEL;
PIEZOELECTRIC TRANSDUCERS;
SILICON;
SURFACES;
VACUUM APPLICATIONS;
VIBRATIONS (MECHANICAL);
ATOMIC RESOLUTION IMAGING;
IMAGE ACQUISITION;
TIP SCAN SPEED;
ULTRAHIGH VACUUM;
SCANNING TUNNELING MICROSCOPY;
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EID: 0031191538
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1148196 Document Type: Article |
Times cited : (50)
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References (21)
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