A new control strategy for high-speed atomic force microscopy

Nanotechnology

Volumn 15, Issue 1, 2004, Pages 108-114

  Schitter, G ^a   Allgower F ^b   Stemmer, A ^a  

^a ETH ZURICH   (Switzerland)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; PHOTODIODES; PIEZOELECTRIC DEVICES; SURFACE TOPOGRAPHY; TWO TERM CONTROL SYSTEMS;

PIEZO SCANNER; TIP-SAMPLE INTERACTION FORCE;

ATOMIC FORCE MICROSCOPY;

EID: 0742286750     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/1/021     Document Type: Article

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