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Ultramicroscopy

Volumn 91, Issue 1-4, 2002, Pages 103-110

Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology

(4) Shin, Hyunjung a Hong, Seungbum a Moon, Jooho b Jeon, Jong Up c

a Samsung Advanced Institute of Technology (SAIT) (South Korea)

b Yonsei University (South Korea)

c University of Ulsan (South Korea)

Author keywords

Atomic force microscopy; Ferroelectric thin film; Piezoresponse imaging; R W mechanism

Indexed keywords

ATOMIC FORCE MICROSCOPY; METALLIC FILMS; PIEZOELECTRICITY;

PIEZORESPONSE MODE;

DATA STORAGE EQUIPMENT;

FERROMAGNETIC MATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; DENSITY; ELECTRONICS; FILM; INFORMATION PROCESSING; INTEGRATION; PIEZOELECTRICITY; STORAGE; TECHNOLOGY;

EID: 0036328578 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(02)00088-8 Document Type: Article

Times cited : (63)

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